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MATERIALS SCIENCE
An atom shifted by a fraction of a picometer: new ptychography reaches where convention fails
Researchers from Tsinghua University have exceeded the electron ptychography thickness threshold by three times, achieving an atomic position precision of 0.39 pm in 85-nanometer silicon. The road to atomic chip quality control.
2026-06-05
MATERIALS SCIENCE
A binder that spoils the cell. New interface chemistry could unlock perovskites
Phosphonic acids destroyed the perovskites from the inside. The new binder extends module life >22% to T90 3000h and brings silicon/perovskite tandems closer to production.
2026-06-05